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Philipp Schroth

Philipp Schroth

Molecular beam epitaxy and X-ray scattering
Focus of research: : III/V Nanowires – Growth dynamics and Polytypism in self-catalyzed GaAs Nanowires grown on Silicon
philipp schrothMgm2∂kit edu

Group: Nanocharacterization

Dipl.-Phys. Philipp Schroth

Current position:
Research Scientist  
Previous positions:


2011     -        Diploma at LAS KIT - “In-situ monitoring of self-organized InAs/GaAs quantum dots“ 

2016     -        PhD at University of Siegen - “Growth of self-catalyzed GaAs nanowires using molecular-beam-epitaxy and structural characterization by in-situ X-ray diffraction”


"YIN Poster Award 2013"

Title: In-situ monitoring of the growth process of self-catalyzed GaAs nanowires on Si (111) with X-ray diffraction P. Schroth, M. Köhl, E. Dimakis, C. Somaschini, L. Geelhaar, J.-W. Hornung, S. Lazarev, S. Bauer, A. Biermanns, U. Pietsch, and T. Baumbach

Field of research:
  • III-V nanostructures
  • MBE of films and nanostructures
  • X-ray scattering
  • Nano- and Micro characterization
Scientific Publications:

M. Köhl, P. Schroth, and T. Baumbach, “Perspectives and limitations of symmetric X-ray Bragg reflectins for inspecting polytypism in nanowires ”, J. Synchrotron Rad. 23 (2016) 487-500

Grigoriev, D. A.; Lazarev, S.; Schroth, P.; Minkevich, A. A.; Köhl, M.; Slobodskyy, T.; Helfrich, M. F.; Schaadt, D. M.; Aschenbrenner, T.; Hommel, D.; Baumbach, T., “Asymmetric skew X-ray diffraction at fixed incidence angle: application to semiconductor nano-objects”, J. Appl. Cryst. (2016). 49, 961-967,

P. Schroth, M. Köhl, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, A. Biermanns, S. Bauer, S. Lazarev, U. Pietsch, and T. Baumbach, “Evolution of Polytypism in GaAs Nanowires during Growth Revealed by Time-Resolved in situ x-ray Diffraction “, Phys. Review Letters 114 (2015) 055504-1 – 055504-6

M. Köhl, P. Schroth, A. A. Minkevich, J.-W. Hornung, E. Dimakis, C. Somaschini, L. Geelhaar, T. Aschenbrenner, S. Lazarev, D. Grigoriev, U. Pietsch, and T. Baumbach, “Polytypism in GaAs nanowires: determination of the interplanar spacing of wurtzite GaAs by X-ray diffraction ”, J. Synchrotron Rad. 22 (2015) 67-75

M. Köhl, P. Schroth, A.A. Minkevich, and T. Baumbach, “Retrieving the displacement of strained nanoobjects: the impact of bounds for the scattering magnitude in direct space”, Optics Express 21 (2013) 27734-27744

T. Slobodskyy, P. Schroth, A. Minkevich, D. Grigoriev, E. Fohtung, M. Riotte, T. Baumbach, M. Powalla, U. Lemmer, and A. Slobodskyy, “Three-dimensional reciprocal space profile of an individual nanocrystallite inside a thin-film solar cell absorber layer”, Journal of Physics D 46 (2013)

T. Slobodskyy, P. Schroth, D. Grigoriev, A. A. Minkevich, D. Z. Hu, D. M. Schaadt, and T. Baumbach, “A portable molecular beam epitaxy system for in situ x-ray investigations at synchrotron beamlines”, Scientific Instruments 83, (2012) 105112-105117

M. Helfrich, P. Schroth, D. Griegoriev, S. Lazarev, R. Felici, T. Slobodskyy, T. Baumbach, and D. Schaadt, “Growth and characterization of site-selective quantum dots”, Physica Status Solidi a 209 (2012) 2387-2401

P. Schroth, T. Slobodskyy, D. Griegoriev, A. Minkevich, M. Riotte, S. Lazarev, E. Fohtung, D.Z. Hu, D.M. Schaadt, and T. Baumbach, “Investigation of buried quantum dots using grazing incidence X-ray diffraction”, Materials Science and Engineering B 177 (2012) 721-724