X-ray Scattering & X-ray Diffraction
Applications of X-ray scattering and diffraction at IPS are concerned with the characterisation of thin films, interfaces and nanostructures in electronic, functional and engineering materials. Such materials play an important role in modern technology – layers of only a few nanometers thickness form the basis of state-of-the-art high-density integrated chip fabrication, while thin films of materials such as carbides or nitrides, with thicknesses of only several tens of nanometers, provide corrosion and temperature resistance for mechanical structures such as aircraft turbine blades.
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Of particular interest is the elucidation of nanoscale structural information during materials processing, for example:
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