Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
-
chair:
A. N.
Danilewsky, J. Wittge, A. Cröll, D. Allen, P. J. McNally, P. Vagovič, T. dos
Santos Rolo, Z. Li, T. Baumbach, E. Gorostegui-Colinas, J. Garagorri, M. R.
Elizalde, M. C. Fossati, D. K. Bowen, B. K. Tanner
-
place:
Journal
of Crystal Growth 318, 1157-1163
-
Date:
2011