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Image Beamline

The IMAGE beamline, currently under construction/commissioning, is a beamline devoted to X-ray imaging applications in material science
ANKA Image Beamline

The main applications of the beamline will be radiographic and tomographic imaging, both in absorption mode and in phase-contrast mode, with a resolution range from approximately 40 µm (projection radiography and tomography) down to 200 nm (full-field microscopy).


Research Fields:

  • Material Research
    In the area of Materials Research there will be facilities for in-situ and in-operando characterization of electronic materials, functional materials, microsystems devices, batteries and multi-phase fluidics.
  • Accelerator research


The IMAGE beamline is being constructed in the western straight-section of the storage ring.
Two experimantal stations will be established for fullfilling different imaging methods.

Station 1: MIQA 
Located in the second experimental hutch, it will be a hard X-ray microscope dedicated to non-destructive testing based on differnt types of deep X-ray lithographical lenses, with an optical resolution down to 200nm.

Station 2: UFO
Located in the second experimantal hutch, it will be dedicated to white-beam computed tomography/laminography coherent imaging by in-line holograph, grating interferometry and 3D micro-diffraction imaging methods

Planned layout of the IMAGE beamline




The radiation source for the beamline is a CLIC wiggler (more information see here).
Key parameters of the planned source are given in the table below:

Parameter CLIC wiggler
Magnetic field B (T) 3
Period lenght (mm) 51
Number of periods 34
K value 14.28
Hor. Source size rsm (mm) 20.932
Ver. Source size rsm (mm) 0.0252

Hor. Source divergence rsm (mrad)

Ver. Source divergence rsm (mrad) 0.107
Critical Energy (keV) 12.126
Total power (kW) 12.12


IMAGE beamline

The IMAGE beamline will offer two experimental stations:

  1. MiQA : a hard X-ray microscope for X-ray optics development and material science. This station will itself be based on X-ray compound refractive lens (CRL) technology developed at IPSA together with the Institute for Microstructure Technology, KIT.
  2. The so-called UFO facility ('Ultra-Fast X-ray Imaging of Scientific Processes with On-line Assessment and Data-driven Process Control') is dedicated to ultra-fast, high-resolution X-ray imaging for life and material sciences and non-destructive testing


  • Various modes of imaging will be implemented including:
    • Contrast modes: absorption, refraction, diffraction, and fluorescence,
    • Imaging modes: 2D microscopy, radiography, topography, and microdiffraction imaging, 3D tomography and laminography,



With these modes, a variety of complementary techniques to obtain different parameters will be accessible, such as:


  • White beam fast radiography and tomography in absorption contrast (distribution of the attenuation coefficients in 2D and 3D),
  • Propagation-based phase contrast imaging for low-Z and weakly absorbing materials, yielding the refractive index distribution, Element-specific imaging at absorption edges for mapping the spatial distribution of specific elements,
  • Full-field X-ray microdiffraction (Rocking Curve) imaging with a spatial resolution at or below the 1 µm scale for analysis and quantification of spatial distributions of crystal lattice misorientations, of defect densities and of local lattice quality in crystalline specimens,
  • Full-field microscopy for imaging on the sub-µm or nm scale (using both direct absorption contrast and Zernike phase contrast),
  • Tomography and laminography for 3D imaging of objects in absorption and phase contrast to determine the 3D distribution of the linear attenuation coefficient or the refractive index

The flexible beamline optics allows the choice of utilising either monochromatic, pink or white beam radiation for optimizing either high contrast or ultrafast imaging.
On-line image reconstruction will permit the immediate assessment of the experimental data and standardized 3D processing, visualization and analysis software will allow an easy interpretation of the results already during the experiment.


On October 14th, MiQA arrived at IMAGE.

MiQA-station is a mechanical positioning system for a hard X-ray microscope and quality assurance station. Specified by IPS/KIT and fabricated by PI|miCos, it cosists of 7 modules for high precision positioning. With optical components like compound refractive lenses (CRLs) or rolled condensers manufactured by IMT/KIT it works as a hard transmission X-ray microscope. MiQA also provides the possibility to mount optical gratings for grating interferometry. The versatile sample stage allows imaging in radiography, tomography and laminography mode. Furthermore, it also serves as quality assurance station for characterization of X-ray optical components.


MIQA Delivery



MIQA Installation in the Experimantal Hutch 2 of the Image beamline