NANO at ANKA is a State of the Art beamline specialized for high-resolution x-ray diffraction, surface and interface X-ray scattering investigation.
The main applications:
- Thin films and multilayers
- Surfaces and interfaces
- Nanostructures (2D and 3D) and nanomaterials
- Real-Time Monitoring of growing Epitaxial thin film, Superlattice and Nano-particles
- Characterization of shape, size, position and their correlations in nanostructures
- Defect analysis in crystal structures
- In-situ and ex-situ growth studies of crystals, organic and inorganic films
