NANO at ANKA is a State of the Art beamline specialized for high-resolution x-ray diffraction, surface and interface X-ray scattering investigation.

The main applications:

• Thin films and multilayers
• Surfaces and interfaces
• Nanostructures (2D and 3D) and nanomaterials
• Real-Time Monitoring of growing Epitaxial thin film, Superlattice and Nano-particles
• Characterization of shape, size, position and their correlations in nanostructures
• Defect analysis in crystal structures
• In-situ and ex-situ growth studies of crystals, organic and inorganic films