Institute for Photon Science and Synchrotron Radiation

Institute for Photon Science and Synchrotron Radiation

Welcome to the Institute for Photon Science and Synchrotron Radiation

Research at the IPS focuses on method-oriented development and applications of X-ray imaging, X-ray spectroscopy, and X-ray scattering techniques in areas of materials and life sciences. Other core areas include the characterisation of materials for information, transport, energy technologies and catalytic processes.

The IPS cooperates closely with other KIT institutes and with leading national and international research institutions and universities. Activities are embedded in the corresponding programs and research fields of the Helmholtz-Association. These activities include the development of state-of-the-art experimental techniques, and conducting both pioneer experiments for the test of new methodological and instrumentation concepts, as well as experimental campaigns for their systematic application. 

Particular emphasis is placed on the scientific and technical education and professional development of students and staff. Research activities are closely linked to academic teaching and research within the KIT Faculties of Physics and Chemistry & Biosciences, as well as at other universities.

Zinc speciation observed in situ during pulsed laser ablation in liquids

 

In situ X-ray scattering, X-ray imaging and X-ray spectroscopy with microsecond time resolution have been combined to clarify the speciation of zinc during ablation

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In-situ XRD Characterization of Epitaxial Iron Oxide-based Thin Films grown by Pulsed-Laser Deposition

 

Hexagonal ferrite oxide materials are promising candidates for high-density, energy-efficient materials for information processing and storage. Using X-ray diffraction (reciprocal-space mapping), we have investigated the structural quality of epitaxial iron-oxide layers grown by pulsed-laser deposition.

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Stress evolution during formation of metal/silicon interfaces

 

In collaboration with the University of Poitiers, we have developed a unique experimental approach combining real-time curvature measurements and synchrotron x-ray reflectivity and diffraction in order to identify the microstructural origins of the stress evolution during sputter deposition of thin films[1]. 

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