Dr. Daniel Hänschke
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Previous positions |
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Field of research |
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Publications
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Efficient diameter enlargement of bulk AlN single crystals with high structural quality
Hartmann, C.; Kabukcuoglu, M. P.; Richter, C.; Klump, A.; Schulz, D.; Juda, U.; Bickermann, M.; Hänschke, D.; Schröder, T.; Straubinger, T.
2023. Applied Physics Express, 16 (7), Art.-Nr.: 075502. doi:10.35848/1882-0786/ace60e -
Dislocation arrangements in 4H-SiC and their influence on the local crystal lattice properties
Roder, M.; Steiner, J.; Wellmann, P.; Kabukcuoglu, M.; Hamann, E.; Haaga, S.; Hänschke, D.; Danilewsky, A.
2023. Journal of Applied Crystallography, 56 (3), 776–786. doi:10.1107/S1600576723003291 -
Dislocation Climb in AlN Crystals Grown at Low-Temperature Gradients Revealed by 3D X-ray Diffraction Imaging
Straubinger, T.; Hartmann, C.; Kabukcuoglu, M. P.; Albrecht, M.; Bickermann, M.; Klump, A.; Bode, S.; Hamann, E.; Haaga, S.; Hurst, M.; Schröder, T.; Hänschke, D.; Richter, C.
2023. Crystal Growth and Design, 23 (3), 1538–1546. doi:10.1021/acs.cgd.2c01131 -
Hierarchically guided in situ nanolaminography for the visualisation of damage nucleation in alloy sheets
Hurst, M.; Helfen, L.; Morgeneyer, T. F.; Suhonen, H.; Buljac, A.; Hild, F.; Suuronen, J.-P.; Baumbach, T.; Hänschke, D.
2023. Scientific Reports, 13 (1), Art.-Nr.: 1055. doi:10.1038/s41598-022-27035-8 -
3D in situ study of damage during a ‘shear to tension’ load path change in an aluminium alloy
Kong, X.; Helfen, L.; Hurst, M.; Hänschke, D.; Missoum-Benziane, D.; Besson, J.; Baumbach, T.; Morgeneyer, T. F.
2022. Acta Materialia, 231, Art.-Nr.: 117842. doi:10.1016/j.actamat.2022.117842 -
X-ray characterization of self-standing bent Si crystal plates for Large Hadron Collider beam extraction
Camattari, R.; Romagnoni, M.; Bandiera, L.; Bagli, E.; Mazzolari, A.; Sytov, A.; Haaga, S.; Kabukcuoglu, M.; Bode, S.; Hänschke, D.; Danilewsky, A.; Baumbach, T.; Bellucci, V.; Guidi, V.; Cavoto, G.
2020. Journal of applied crystallography, 53 (2), 486–493. doi:10.1107/S1600576720002800 -
Mit Röntgenblick auf Geheimnissuche
Riemann, K.; Hänschke, D.; Zuber, M.; Hamann, E.
2019. Schlösser Baden-Württemberg, 2019 (3), 28–30 -
X-ray topo-tomography studies of linear dislocations in silicon single crystals
Asadchikov, V.; Buzmakov, A.; Chukhovskii, F.; Dyachkova, I.; Zolotov, D.; Danilewsky, A.; Baumbach, T.; Bode, S.; Haaga, S.; Hänschke, D.; Kabukcuoglu, M.; Balzer, M.; Caselle, M.; Suvorov, E.
2018. Journal of applied crystallography, 51 (6). doi:10.1107/S160057671801419X -
Neuartiger Röntgenblick auf Kristallversetzungen – Materialforschung
Hänschke, D.; Hamann, E.; Baumbach, T.
2018. Physik in unserer Zeit, 49 (2), 58–59. doi:10.1002/piuz.201870204 -
Correlated Three-Dimensional Imaging of Dislocations: Insights into the Onset of Thermal Slip in Semiconductor Wafers
Hänschke, D.; Danilewsky, A.; Helfen, L.; Hamann, E.; Baumbach, T.
2017. Physical review letters, 119 (21), Art. Nr.: 215504. doi:10.1103/PhysRevLett.119.215504 -
Syris : A flexible and efficient framework for X-ray imaging experiments simulation
Farago, T.; Mikulik, P.; Ershov, A.; Vogelgesang, M.; Hänschke, D.; Baumbach, T.
2017. Journal of synchrotron radiation, 24 (6), 1283–1295. doi:10.1107/S1600577517012255 -
Gauging low-dose X-ray phase-contrast imaging at a single and large propagation distance
Hofmann, R.; Schober, A.; Hahn, S.; Moosmann, J.; Kashef, J.; Hertel, M.; Weinhardt, V.; Hänschke, D.; Helfen, L.; Salazar, I. A. S.; Guigay, J.-P.; Xiao, X.; Baumbach, T.
2016. Optics express, 24 (4), 4331–4348. doi:10.1364/OE.24.004331 -
Development and Correlative Application of X-Ray Diffrachtion Laminography. PhD dissertation
Hänschke, D.
2015. Verlag Dr. Hut -
Influence of a low-temperature capping on the crystalline structure and morphology of InGaN quantum dot structures
Krause, B.; Miljevic, B.; Aschenbrenner, T.; Piskorska-Hommel, E.; Tessare, C.; Barchuk, M.; Buth, G.; Donfeu Tchana, R.; Figge, S.; Gutowski, J.; Hänschke, D.; Kalden, J.; Laurus, T.; Lazarev, S.; Magalhaes-Paniago, R.; Sebald, K.; Wolska, A.; Hommel, D.; Falta, J.; Holy, V.; Baumbach, T.
2014. Journal of alloys and compounds, 585, 572–579. doi:10.1016/j.jallcom.2013.09.005 -
Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications
Cecilia, A.; Jary, V.; Nikl, M.; Mihokova, E.; Hänschke, D.; Hamann, E.; Douissard, P. A.; Rack, A.; Martin, T.; Krause, B.; Grigorievc, D.; Baumbach, T.; Fiederle, M.
2014. Radiation Measurements, 62, 28–34. doi:10.1016/j.radmeas.2013.12.005 -
High-resolution X-ray phase-contrast tomography from single-distance radiographs applied to developmental stages of Xenopus laevis
Moosmann, J.; Altapova, V.; Helfen, L.; Hänschke, D.; Hofmann, R.; Baumbach, T.
2013. Journal of Physics: Conference Series, 425, 192003/1–5. doi:10.1088/1742-6596/425/19/192003 -
Phase contrast laminography based on Talbot interferometry
Altapova, V.; Helfen, L.; Myagotin, A.; Hänschke, D.; Moosmann, J.; Gunneweg, J.; Baumbach, T.
2012. Optics Express, 20 (6), 6496–6508. doi:10.1364/OE.20.006496 -
High-resolution X-ray phase-contrast tomography from single-distance radiographs applied to developmental stages of Xenopus laevis
Moosmann, J.; Altapova, V.; Helfen, L.; Hänschke, D.; Hofmann, R.; Baumbach, T.
2012. 11th Internat.Conf.on Synchrotron Radiation Instrumentation (SRI 2012), Lyon, July 9-13, 2012 -
Diffraction lamonography applied to 3-dimensional imaging of dislocation networks in silicon wafers
Hänschke, D.; Helfen, L.; Altapova, V.; Moosmann, J.; Hamann, E.; Wittge, J.; Danilewsky, A. N.; Baumbach, T.
2012. 11th Biennial Conf.on High Resolution X-Ray Diffraction and Imaging (XTOP 2012), St.Petersburg, Russia, September 15-20, 2012 -
Gratings based multiple contrast laminography
Altapova, V.; Helfen, L.; Moosmann, J.; Hänschke, D.; Chen, F.; Kenntner, J.; Mohr, J.; Baumbach, T.
2012. Poster: 11th Internat.Conf.on Synchrotron Radiation Instrumentation (SRI 2012), Lyon, July 9-13, 2012 -
3-dimensional imaging of dislocation in silicon wafers by diffraction laminography
Hänschke, D.; Helfen, L.; Altapova, V.; Pelliccia, D.; Yang, Y.; Zimina, A.; Tkachuk, A.; Hornberger, B.; Palshin, V.; Feser, M.; Baumbach, T.
2012. Poster: 11th Internat.Conf.on Synchrotron Radiation Instrumentation (SRI 2012), Lyon, July 9-13, 2012 -
Nonlinear single distance phase retrieval for development biology
Hofmann, M.; Moosmann, J.; Altapova, V.; Hänschke, D.; Baumbach, T.
2012. Poster: 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012), Lyon, F, July 9-13, 2012 -
Three-dimensional imaging of dislocations by X-ray diffraction laminography
Hänschke, D.; Helfen, L.; Altapova, V.; Danilewsky, A.; Baumbach, T.
2012. Applied Physics Letters, 101, 244103/1–4. doi:10.1063/1.4769988 -
In-line Bragg magnifier based on V-shaped germanium crystals
Vagovic, P.; Korytar, D.; Mikulik, P.; Cecilia, A.; Ferrari, C.; Yang, Y.; Hänschke, D.; Hamann, E.; Pelliccia, D.; Lafford, T. A.; Fiederle, M.; Baumbach, T.
2011. Journal of Synchrotron Radiation, 18, 753–760. doi:10.1107/S090904951102989X -
Application of Medipix2 single photon detectors at the ANKA synchrotron facility
Hamann, E.; Cecilia, A.; Vagovic, P.; Hänschke, D.; Butzer, J.; Greiffenberg, D.; Fauler, A.; Baumbach, T.; Fiederle, M.
2011. Ziock, K. [Hrsg.] IEEE Nuclear Science Symp. (NSS 2010) and Medical Imaging Conf. (MIC 2010), Knoxville, Tenn., October 30 - November 5, 2010 Proc.on DVD-ROM Piscataway, N.J. : IEEE, 2011, IEEE Nuclear Science Symp. (NSS 2010) and Medical Imaging Conf. (MIC 2010 2010), Knoxville, TN, USA, October 30–November 5, 2010 -
Application of Medipix2 single photon detectors at the ANKA synchrotron facility
Hamann, E.; Cecilia, A.; Vagovic, P.; Hänschke, D.; Butzer, J.; Greiffenberg, D.; Fauler, A.; Baumbach, T.; Fiederle, M.
2011. IEEE Nuclear Science Symposium conference record (NSS/MIC), 2010 : [including] the 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and the 17th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD) ; Oct. 30, 2010 - Nov. 6, 2010, Knoxville, Tennessee. Ed.: K. Ziock, 3860–3863, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/NSSMIC.2010.5874536 -
X-ray imaging at ANKA
Pelliccia, D.; Vagovic, P.; Helfen, L.; Cecilia, A.; Santos Rolo, T. dos; Ershov, A.; Li, Z.; Xu, F.; Altapova, V.; Hänschke, D.; Hofmann, R.; Moosman, J.; Baumbach, T.
2009. ANKA - Annual Report 2009 Karlsruhe : Karlsruhe Institute of Technology Also publ.online, 35–42
Further Publications
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