• large area sample mapping giving a full image of strain/defect topography of the sample;
• cross-sectional slice images through the sample (in a manner analogous to TEM);
• 3D directionality of crystal defects;
• fine lateral resolution (<1μm) over large areas.

Microtomography and microradiography allows, in a non-destructive manner, to image the internal structure of an object. Microtomography using synchrotron light sources delivers three-dimensional (3D) images of the object with high resolutions down to the submicrometer range, an excellent signal-to-noise ratio and additional contrast modes like phase contrast and holotomography. Typical applications for microtomography and microradiography are:

• detection of voids and pores in industrial components;
• imaging tissue and other soft materials in biological and life science;
• pore formation in metal foams, evolution of particle coarsening in materials science;
• crack propagation;
• diffusion processes in woven materials;
• characterization of fibre structures, porous media, particle agglomerations by microtomography and a subsequent 3D image analysis.

Important! Currently only topography measurements are available for external user groups.

White beam X-ray topography:
Detailed information on defect distributions in crystals can be provided by synchrotron X-ray topography in which an intense, highly collimated beam of X-rays is directed onto a crystalline sample in Laue or Bragg configuration. This non-destructive analysis technique is mainly used for the study of dislocations, planar defects, stacking faults, growth defects or large precipitates. Also very small local defects like nm-scale voids in Si can be imaged as well as long range strain in electronic devices.

High-resolution synchrotron radiography and microtomography
High-resolution and phase contrast radiography are used to investigate micro-structured, multi-component material systems, e.g. to detect delaminations between substrates and glob tops encapsulating wire-bonded devices. Radiographs taken from different projection angles allow to obtain 3D information with a spatial resolution down to the sub-micrometer range by means of computed microtomography. The subsequent application of 3D image analysis methods can be used for the determination of size distributions, orientations or spatial correlations within the tomographic multi-constituent volume images.

Phase contrast imaging with a grating interferometer:
Phase contrast imaging with a grating interferometer provides determination of the refractive index distribution within a sample even for materials with similar refractive indices. The TOPO-TOMO whitebeam station enables high phase sensitivity and spatial resolution of about 5 μm together with a short exposure time below 1 s. By combining a grating interferometer with computed tomography, the refractive index distribution can be acquired in a 3D volume.

Topography set-up at Topo-Tomo: Mirror heater for high temperature in-situ experiments

Topographic in situ experiment (1) Mirror shell and lamp housing (2) Window for diffracted beam (3) Translation/ rotation (4) CCD camera system (5) Shutter (6) Vacuum slits

Important! Currently only topography measurements are available for external user groups.