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The NANO Beamline at the KIT Light Source is dedicated to high-resolution X-ray diffraction, surface and interface X-ray scattering investigations. The beamline has been optimized to deliver a monochromatic and highly collimated beam with sufficient flux to investigate structural changes and strain evolution during the growth of epitaxial films and superlattices.
In order to carry out real time measurements, different types of environmental chambers, e.g., for molecular beam epitaxy, are mounted on the heavy duty diffractometer which supports up to 500 kg. The diffractometer allows rotation of the sample and the environmental parts in all directions in space. With two different detection systems on the diffractometer, it is possible to perform simultaneous measurement such as Grazing Incidence Small Angle X-ray Scattering (GISAXS), to determine the shape, size, position and correlation in nanostructures, and Grazing Incidence Diffraction (GID) to characterize the surface-patterned structure. One of the main uses of the beamline is to study interface properties like roughness and correlation even for weakly scattering materials such as organic semiconductors.
A further focus of our research is the real time monitoring of nanoparticles and nanostructures. |
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Methods and applications
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The main scientific applications of the NANO beamine are:
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Publications
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Time-Resolved Morphology and Kinetic Studies of Pulsed Laser Deposition-Grown Pt Layers on Sapphire at Different Growth Temperatures by in Situ Grazing Incidence Small-Angle X-ray Scattering.
Bauer, S.; Rodrigues, A.; Horák, L.; Nergis, B.; Jin, X.; Schneider, R.; Gröger, R.; Baumbach, T.; Holý, V.
2021. Langmuir, acs.langmuir.0c02952. doi:10.1021/acs.langmuir.0c02952 -
In situ grazing-incidence x-ray scattering study of pulsed-laser deposition of Pt layers.
Holý, V.; Bauer, S.; Rodrigues, A.; Horák, L.; Jin, X.; Schneider, R.; Baumbach, T.
2020. Physical review / B, 102 (12), Article: 125435. doi:10.1103/PhysRevB.102.125435 -
Combined In Situ XRD and Ex Situ TEM Studies of Thin BaSrTiO Films Grown by PLD on MgO.
Bauer, S.; Rodrigues, A.; Jin, X.; Schneider, R.; Müller, E.; Gerthsen, D.; Baumbach, T.
2020. Crystal research and technology, 55 (9), Art. Nr.: 1900235. doi:10.1002/crat.201900235 -
Structure Quality of LuFeO3 Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt.
Bauer, S.; Rodrigues, A.; Horák, L.; Jin, X.; Schneider, R.; Baumbach, T.; Holý, V.
2020. Materials, 13 (1), Art. Nr.: 61. doi:10.3390/ma13010061 -
Revealing misfit dislocations in InAsP-InP core–shell nanowires by x-ray diffraction.
Lazarev, S.; Göransson, D. J. O.; Borgström, M.; Messing, M. E.; Xu, H. Q.; Dzhigaev, D.; Yefanov, O. M.; Bauer, S.; Baumbach, T.; Feidenhans’l, R.; Samuelson, L.; Vartanyants, I. A.
2019. Nanotechnology, 30 (50), Article: 505703. doi:10.1088/1361-6528/ab40f1 -
Real time in situ x-ray diffraction study of the crystalline structure modification of Ba0.5Sr0.5TiO₃ during the post-annealing.
Bauer, S.; Rodrigues, A.; Baumbach, T.
2018. Scientific reports, 8 (1), Article No. 11969. doi:10.1038/s41598-018-30392-y -
Effect of post-annealing on the chemical state and crystalline structure of PLD Ba0.5Sr0.5TiO3 films analyzed by combined synchrotron X-ray diffraction and X-ray photoelectron spectroscopy.
Rodrigues, A.; Bauer, S.; Baumbach, T.
2018. Ceramics international, 44 (13), 16017–16024. doi:10.1016/j.ceramint.2018.06.038 -
Optimizing structural and mechanical properties of cryogel scaffolds for use in prostate cancer cell culturing.
Cecilia, A.; Baecker, A.; Rack, A.; Hamann, E.; van de Kamp, T.; Gruhl, F. J.; Hofmann, R.; Moosmann, J.; Hahn, S.; Kashef, J.; Bauer, S.; Faragó, T.; Helfen, L.; Baumbach, T.
2017. Materials science and engineering / C, 71, 465–472. doi:10.1016/j.msec.2016.10.038 -
Microwave synthesis of high-quality and uniform 4 nm ZnFe₂O₄ nanocrystals for application in energy storage and nanomagnetics.
Suchomski, C.; Breitung, B.; Witte, R.; Knapp, M.; Bauer, S.; Baumbach, T.; Reitz, C.; Brezesinski, T.
2016. Beilstein journal of nanotechnology, 7, 1350–1360. doi:10.3762/bjnano.7.126 -
In operando study of the high voltage spinel cathode material LiNi₀̣₅Mn₁̣₅O₄ using two dimensional full-field spectroscopic imaging of Ni and Mn.
Bauer, S.; De Biasi, L.; Glatthaar, S.; Toukam, L.; Geßwein, H.; Baumbach, T.
2015. Physical chemistry, chemical physics, 17, 16388–16397. doi:10.1039/C5CP02075A -
Three-dimensional reciprocal space mapping with a two-dimensional detector as a low-latency tool for investigating the influence of growth parameters on defects in semipolar GaN.
Bauer, S.; Lazarev, S.; Bauer, M.; Meisch, T.; Caliebe, M.; Holy, V.; Scholz, F.; Baumbach, T.
2015. Journal of applied crystallography, 48, 1000–1010. doi:10.1107/S1600576715009085 -
The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba₀̣₅Sr₀̣₅TiO₃ on MgO.
Bauer, S.; Lazarev, S.; Molinari, A.; Breitenstein, A.; Leufke, P.; Kruk, R.; Hahn, H.; Baumbach, T.
2014. Journal of Synchrotron Radiation, 21 (2), 386–394. doi:10.1107/S1600577513034358 -
Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar (1122) GaN layers grown from the sidewall of an r-patterned sapphire substrate.
Lazarev, S.; Bauer, S.; Meisch, T.; Bauer, M.; Tischer, I.; Barchuk, M.; Thonke, K.; Holy, V.; Scholz, F.; Baumbach, T.
2013. Journal of applied crystallography, 46 (5), 1425–1433. doi:10.1107/S0021889813020438 -
Growth and doping of semipolar GaN grown on patterned sapphire substrates.
Scholz, F.; Meisch, T.; Caliebe, M.; Schörner, S.; Thonke, K.; Kirste, L.; Bauer, S.; Lazarev, S.; Baumbach, T.
2014. Journal of crystal growth, 405, 97–101. doi:10.1016/j.jcrysgro.2014.08.006 -
Studies on defect reduction in AlGaN heterostructures by integrating an in-situ SiN interlayer.
Scholz, F.; Forghani, K.; Klein, M.; Klein, O.; Kaiser, U.; Neuschl, B.; Tischer, I.; Feneberg, M.; Thonke, K.; Lazarev, S.; Bauer, S.; Baumbach, T.
2013. Japanese journal of applied physics, 52 (8S), 08JJ07/1–4. doi:10.7567/JJAP.52.08JJ07 -
High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure.
Lazarev, S.; Bauer, S.; Forghani, K.; Barchuk, M.; Scholz, F.; Baumbach, T.
2013. Journal of Crystal Growth, 370, 51–56. doi:10.1016/j.jcrysgro.2012.07.033 -
Study of threading dislocation density reduction in AlGaN epilayers by Monte Carlo simulation of high-resolution reciprocal-space maps of a two-layer system.
Lazarev, S.; Barchuk, M.; Bauer, S.; Forghani, K.; Holy, V.; Baumbach, T.; Scholz, F.
2013. Journal of applied crystallography, 46 (Part 1), 120–127. doi:10.1107/S0021889812043051 -
Simulation of X-ray beamlines with the new ray tracing tool XTrace.
Bauer, S. T.; Bauer, M.; Steininger, R.; Baumbach, T.
2007. Nuclear instruments & methods in physics research / A, (2007), 582 (1), 90–92. doi:10.1016/j.nima.2007.08.068
| name | function | |
|---|---|---|
| Bauer, Sondes | Deputy Head of Department, Beamline Scientist | sondes bauerUva4∂kit edu |