Dr. Sondes Bauer


  1. Effect of pulse laser frequency on PLD growth of LuFeO3 explained by kinetic simulations of in-situ diffracted intensities
    Gabriel, V.; Kocán, P.; Bauer, S.; Nergis, B.; Rodrigues, A.; Horák, L.; Jin, X.; Schneider, R.; Baumbach, T.; Holý, V.
    2022. Scientific Reports, 12 (1), Artkl.Nr.:5647. doi:10.1038/s41598-022-09414-3
  2. Time-Resolved Morphology and Kinetic Studies of Pulsed Laser Deposition-Grown Pt Layers on Sapphire at Different Growth Temperatures by in Situ Grazing Incidence Small-Angle X-ray Scattering
    Bauer, S.; Rodrigues, A.; Horák, L.; Nergis, B.; Jin, X.; Schneider, R.; Gröger, R.; Baumbach, T.; Holý, V.
    2021. Langmuir, 37 (2), 734–749. doi:10.1021/acs.langmuir.0c02952
  3. Combined In Situ XRD and Ex Situ TEM Studies of Thin BaSrTiO Films Grown by PLD on MgO
    Bauer, S.; Rodrigues, A.; Jin, X.; Schneider, R.; Müller, E.; Gerthsen, D.; Baumbach, T.
    2020. Crystal research and technology, 55 (9), Art. Nr.: 1900235. doi:10.1002/crat.201900235
  4. In situ grazing-incidence x-ray scattering study of pulsed-laser deposition of Pt layers
    Holý, V.; Bauer, S.; Rodrigues, A.; Horák, L.; Jin, X.; Schneider, R.; Baumbach, T.
    2020. Physical review / B, 102 (12), Article: 125435. doi:10.1103/PhysRevB.102.125435
  5. Structure Quality of LuFeO3 Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt
    Bauer, S.; Rodrigues, A.; Horák, L.; Jin, X.; Schneider, R.; Baumbach, T.; Holý, V.
    2020. Materials, 13 (1), Art. Nr.: 61. doi:10.3390/ma13010061
  6. Revealing misfit dislocations in InAsP-InP core–shell nanowires by x-ray diffraction
    Lazarev, S.; Göransson, D. J. O.; Borgström, M.; Messing, M. E.; Xu, H. Q.; Dzhigaev, D.; Yefanov, O. M.; Bauer, S.; Baumbach, T.; Feidenhans’l, R.; Samuelson, L.; Vartanyants, I. A.
    2019. Nanotechnology, 30 (50), Article: 505703. doi:10.1088/1361-6528/ab40f1
  7. Real time in situ x-ray diffraction study of the crystalline structure modification of Ba0.5Sr0.5TiO₃ during the post-annealing
    Bauer, S.; Rodrigues, A.; Baumbach, T.
    2018. Scientific reports, 8 (1), Article No. 11969. doi:10.1038/s41598-018-30392-y
  8. Effect of post-annealing on the chemical state and crystalline structure of PLD Ba0.5Sr0.5TiO3 films analyzed by combined synchrotron X-ray diffraction and X-ray photoelectron spectroscopy
    Rodrigues, A.; Bauer, S.; Baumbach, T.
    2018. Ceramics international, 44 (13), 16017–16024. doi:10.1016/j.ceramint.2018.06.038
  9. Optimizing structural and mechanical properties of cryogel scaffolds for use in prostate cancer cell culturing
    Cecilia, A.; Baecker, A.; Rack, A.; Hamann, E.; Kamp, T. van de; Gruhl, F. J.; Hofmann, R.; Moosmann, J.; Hahn, S.; Kashef, J.; Bauer, S.; Faragó, T.; Helfen, L.; Baumbach, T.
    2017. Materials science and engineering / C, 71, 465–472. doi:10.1016/j.msec.2016.10.038
  10. Microwave synthesis of high-quality and uniform 4 nm ZnFe₂O₄ nanocrystals for application in energy storage and nanomagnetics
    Suchomski, C.; Breitung, B.; Witte, R.; Knapp, M.; Bauer, S.; Baumbach, T.; Reitz, C.; Brezesinski, T.
    2016. Beilstein journal of nanotechnology, 7, 1350–1360. doi:10.3762/bjnano.7.126
  11. In operando study of the high voltage spinel cathode material LiNi₀̣₅Mn₁̣₅O₄ using two dimensional full-field spectroscopic imaging of Ni and Mn
    Bauer, S.; De Biasi, L.; Glatthaar, S.; Toukam, L.; Geßwein, H.; Baumbach, T.
    2015. Physical chemistry, chemical physics, 17, 16388–16397. doi:10.1039/C5CP02075A
  12. Evolution of polytypism in GaAs nanowires during growth revealed by time-resolved in situ x-ray diffraction
    Schroth, P.; Köhl, M.; Hornung, J.-W.; Dimakis, E.; Somaschini, C.; Geelhaar, L.; Biermanns, A.; Bauer, S.; Lazarev, S.; Pietsch, U.; Baumbach, T.
    2015. Physical review letters, 114, 055504/1–6. doi:10.1103/PhysRevLett.114.055504
  13. Three-dimensional reciprocal space mapping with a two-dimensional detector as a low-latency tool for investigating the influence of growth parameters on defects in semipolar GaN
    Bauer, S.; Lazarev, S.; Bauer, M.; Meisch, T.; Caliebe, M.; Holy, V.; Scholz, F.; Baumbach, T.
    2015. Journal of applied crystallography, 48, 1000–1010. doi:10.1107/S1600576715009085
  14. The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba₀̣₅Sr₀̣₅TiO₃ on MgO
    Bauer, S.; Lazarev, S.; Molinari, A.; Breitenstein, A.; Leufke, P.; Kruk, R.; Hahn, H.; Baumbach, T.
    2014. Journal of Synchrotron Radiation, 21 (2), 386–394. doi:10.1107/S1600577513034358
  15. Growth and doping of semipolar GaN grown on patterned sapphire substrates
    Scholz, F.; Meisch, T.; Caliebe, M.; Schörner, S.; Thonke, K.; Kirste, L.; Bauer, S.; Lazarev, S.; Baumbach, T.
    2014. Journal of crystal growth, 405, 97–101. doi:10.1016/j.jcrysgro.2014.08.006
  16. Three-dimensional reciprocal space mapping of diffuse scattering for the study of stacking faults in semipolar (1122) GaN layers grown from the sidewall of an r-patterned sapphire substrate
    Lazarev, S.; Bauer, S.; Meisch, T.; Bauer, M.; Tischer, I.; Barchuk, M.; Thonke, K.; Holy, V.; Scholz, F.; Baumbach, T.
    2013. Journal of applied crystallography, 46 (5), 1425–1433. doi:10.1107/S0021889813020438
  17. Studies on defect reduction in AlGaN heterostructures by integrating an in-situ SiN interlayer
    Scholz, F.; Forghani, K.; Klein, M.; Klein, O.; Kaiser, U.; Neuschl, B.; Tischer, I.; Feneberg, M.; Thonke, K.; Lazarev, S.; Bauer, S.; Baumbach, T.
    2013. Japanese journal of applied physics, 52 (8S), 08JJ07/1–4. doi:10.7567/JJAP.52.08JJ07
  18. High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure
    Lazarev, S.; Bauer, S.; Forghani, K.; Barchuk, M.; Scholz, F.; Baumbach, T.
    2013. Journal of Crystal Growth, 370, 51–56. doi:10.1016/j.jcrysgro.2012.07.033
  19. Study of threading dislocation density reduction in AlGaN epilayers by Monte Carlo simulation of high-resolution reciprocal-space maps of a two-layer system
    Lazarev, S.; Barchuk, M.; Bauer, S.; Forghani, K.; Holy, V.; Baumbach, T.; Scholz, F.
    2013. Journal of applied crystallography, 46 (Part 1), 120–127. doi:10.1107/S0021889812043051
  20. Simulation of X-ray beamlines with the new ray tracing tool XTrace
    Bauer, S. T.; Bauer, M.; Steininger, R.; Baumbach, T.
    2007. Nuclear instruments & methods in physics research / A, (2007), 582 (1), 90–92. doi:10.1016/j.nima.2007.08.068
Further Publications
Title Author Source Date Link
A. Rack, H. Riesemeier, P. Vagovic, T. Weitkamp, F. Siewert, R. Dietsch, W. Diete, S. Bauer Trabelsi, T. Waterstradt, T. Baumbach AIP Conference Proceedings 1234, 740-743 2010